Atomic Force Microscopy

Atomic Force Microscope | JPK Instruments, Nanowizard 3

Location: LFG, Haberstraße 9a, 91058 Erlangen, Room 01.814

The NanoWizard® 3 is an AFM system designed for optimal use in liquid characterization, but can also be used in air or a controlled environment. It provides the highest quality data for imaging and force measurements in both liquids and air. The NanoWizard® 3 is easy to set up and ready to use in minutes with full optical imaging capability, allowing the user to select high NA (numerical aperture) immersion objectives and a wide range of detectors and cameras to suit their experimental requirements.

M. Sc. Maret Ickler

Instrument specifications:

  • AFM with reproducible tip positioning and long-term position stability
  • Low coherence IR deflection detection light source for interference-free measurements

NanoWizard® 3 head:

  • Robust, low-noise design and drift-minimised mechanics
  • High detector bandwidth of 8 MHz for high-speed signal detection
  • Liquid-safe design
  • Built-in optical filters for fluorescence without side signal effects
  • Laser safety glass 3R
  • 100 x 100 x 15 µm3 scanning range

Stages:

  • Liquid-tight, rugged and drift-minimized design for maximum stability
  • Motorised 20 x 20 mm2 precision stage with joystick or software control, manual control also possible
  • Independent positioning of tip and sample relative to the optical axis

Sample holders:

  • Holders for Petri dishes, coverslips, microscope slides or SPM metal holders
  • Special holders and liquid cuvettes available
  • Ø 140 x 18 mm3 free sample volume

Temperature control:

  • RT to 300°C, ± 0.1°C with JPK High Temperature Heating Stage (HTHSTM)
  • -35°C to 120°C, ± 0.1°C with JPK Heating Cooling Module (HCMTM)
  • All heaters and heating/cooling solutions are software controlled

https://www.nanophys.kth.se/nanolab/afm/jpk/jpk-nanowizard-3-bioscience.pdf

Further information to follow